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Faculty of Electronics, Photonics and Microsystems

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hr-excellence

dr hab. inż. Tomasz Piasecki

Email: tomasz.piasecki@pwr.edu.pl
Structure: Faculty of Electronics, Photonics and Microsystems (N) » Department of Nanometrology

Head of Department of Nanometrology

ul. Janiszewskiego 11/17, 50-372 Wrocław
building C-2, room 405
phone +48 71 320 3482

Research fields

  • Electrical and mechanical characterisation of MEMS and NEMS devices
  • Measurements of materials' electric properties
  • Electronic instrumentation for precise electrical measurements
  • Electric measurement methods in microbiology and biochemistry
  • Signal processing in metrology

ORCID

Researchgate

Google Scholar

Author profile in SCOPUS and DONA

Selected publications
1
Artykuł
2025
Grzegorz Guła, Grażyna Majkowska-Skrobek, Anna Misterkiewicz, Weronika Salwińska, Tomasz Piasecki Zuzanna Drulis-Kawa,
Klebsiella lytic phages induce Pseudomonas aeruginosa PAO1 biofilm formation. Viruses. 2025, vol. 17, nr 5, art. 615, s. 1-17. ISSN: 1999-4915
Zasoby:DOISFXImpact FactorLista FiladelfijskaLista MNiSWOpen Access
2
Artykuł
2025
Bartosz Cz Pruchnik Krzysztof Kwoka Tomasz Piasecki Masoud Jedari Ghourichaei, Umut Kerimzade, Onur Aydin, Bekir Aksoy, Cemal Aydogan, Gokhan Nadar, Ivo Rangelow, Arda Deniz Yalcinkaya, Halil Bayraktar, Burhanettin Erdem Alaca, Teodor Gotszalk
Characterization of a hybrid nanowire-MEMS force sensor using direct actuation. Measurement Science & Technology. 2025, vol. 36, nr 7, art. 075024, s. 1-10. ISSN: 0957-0233; 1361-6501
Zasoby:DOISFXImpact FactorLista FiladelfijskaLista MNiSWOpen Access
3
Artykuł
2025
Piotr Smagowski Tomasz Piasecki Maciej Rudek
Miniaturized transformer bridge setup for scanning thermal microscopy applications. IEEE Transactions on Instrumentation and Measurement. 2025, vol. 74, s. 1-7. ISSN: 0018-9456; 1557-9662
Zasoby:DOISFXImpact FactorLista FiladelfijskaLista MNiSWOpen Access
4
Artykuł
2025
Masoud Jedari Ghourichaei, Umut Kerimzade, Levent Demirkazik, Bartosz Cz Pruchnik Krzysztof Kwoka Dominik Badura Tomasz Piasecki Alp Timucin Toymus, Onur Aydin, Bekir Aksoy, Cemal Aydogan, Gokhan Nadar, Ivo Rangelow, Levent Beker, Arda Deniz Yalcinkaya, Halil Bayraktar, Teodor Gotszalk Burhanettin Erdem Alaca,
Multiscale fabrication and characterization of a NEMS force sensor. Advanced Materials Technologies. 2025, vol. 10, nr 4, s. 1-9. ISSN: 2365-709X; 2365-709X
Zasoby:DOIURLSFXImpact FactorLista FiladelfijskaLista MNiSWOpen Access
5
Artykuł
2024
René Laflamme, Piotr Putek Tomasz Piasecki Teodor Gotszalk
Digital analysis of damped vibrations. IEEE Instrumentation & Measurement Magazine. 2024, vol. 27, nr 5, s. 52-61. ISSN: 1094-6969; 1941-0123
Zasoby:DOIURLSFXImpact FactorLista FiladelfijskaLista MNiSW
6
Artykuł
2024
Bartosz Cz Pruchnik Krzysztof Kwoka Ewelina Gacka Dominik Badura Piotr M Kunicki Andrzej Sierakowski, Paweł Janus, Tomasz Piasecki Teodor Gotszalk
New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructures. Beilstein Journal of Nanotechnology. 2024, vol. 15, s. 1273-1282. ISSN: 2190-4286
Zasoby:DOIURLSFXImpact FactorLista FiladelfijskaLista MNiSWOpen Access
7
Artykuł
2024
Andrzej Sikora Krzysztof R Gajewski Dominik Badura Bartosz Cz Pruchnik Tomasz Piasecki Kamil Raczkowski, Teodor Gotszalk
Conductive Atomic Force Microscopy—ultralow-current measurement systems for nanoscale imaging of a surface’s electrical properties. Sensors. 2024, vol. 24, nr 17, art. 5649, s. 1-13. ISSN: 1424-8220
Zasoby:DOIURLSFXImpact FactorLista FiladelfijskaLista MNiSWOpen Access
8
Artykuł
2024
Monika Trzebiatowska, Dorota A Kowalska, Agnieszka Ciżman Natalia A Wójcik, Ryszard J Barczyński, Adam Pikul, Jan K Zaręba Marcin Palewicz Tomasz Piasecki Krystian Roleder, Marek A Gusowski Mirosław Mączka,
The influence of azide and imidazole on the properties of Mn- and Cd-based networks: conductivity and nonlinear phenomena. Journal of Materials Chemistry. C. 2024, vol. 12, nr 37, s. 15119-15136. ISSN: 2050-7526; 2050-7534
Zasoby:DOIURLSFXImpact FactorLista FiladelfijskaLista MNiSW
9
Artykuł
2024
Bartosz Cz Pruchnik Piotr Smagowski Dominik Badura Tomasz Piasecki Wiktor Połacik, Piotr Putek Teodor Gotszalk
Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes. Measurement Science & Technology. 2024, vol. 35, nr 8, art. 085901, s. 1-9. ISSN: 0957-0233; 1361-6501
Zasoby:DOISFXImpact FactorLista FiladelfijskaLista MNiSWOpen Access
10
Artykuł
2024
Bartosz Cz Pruchnik Andrzej Sikora Krzysztof R Gajewski Bartosz Świadkowski Piotr Smagowski Dominik Badura Krzysztof Kwoka Tomasz Piasecki Teodor Gotszalk
Educational scanning tunneling microscope – open architecture platform for nanotechnology teaching and nanometrology research. Przegląd Elektrotechniczny. 2024, R. 100, nr 6, s. 200-204. ISSN: 0033-2097; 2449-9544
Zasoby:DOIURLImpact FactorLista FiladelfijskaLista MNiSWOpen Access

All employee publications

Politechnika Wrocławska ©