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Faculty of Electronics, Photonics and Microsystems

dr hab. inż. Andrzej Sikora

Email: andrzej.sikora@pwr.edu.pl

Structure: Faculty of Electronics, Photonics and Microsystems (N) » Department of Nanometrology

Department of Nanometrology, bldg. C-2, room 104
Janiszewskiego 11-17
50-372 Wroclaw
POLAND
tel.: + 48 71 320 32 59

http://www.researchgate.net/profile/Andrzej_Sikora/

https://orcid.org/0000-0001-6649-1963

DONA

Scientific activity

The investigation of mechanical and electrical properties of materials at micro- and nanoscale; development of the near field microscopy techniques, with particular focus on the atomic force microscopy; nanodiagnostic; nanometrology; development and designing of the electronic devices, in particular the measurement systems

Selected publications

Artykuł

2024

Sylwia Charazińska, Andrzej Sikora Beata Malczewska, Paweł Lochyński,

Reconstruction of the passive layer of AISI 304 and 316 steel after scratching. Materials. 2024, vol. 17, nr 24, art. 6238, s. 1-14. ISSN: 1996-1944
Zasoby:DOI URL SFX

Artykuł

2024

Andrzej Sikora Jakub Totczyk,

Fiber optics vibration sensor with selftest functionality. Przegląd Elektrotechniczny. 2024, R. 100, nr 11, s. 295-297. ISSN: 0033-2097; 2449-9544
Zasoby:DOI URL

Artykuł

2024

Mateusz Gramala, Andrzej Sikora Aleksandra Chudzyńska, Łukasz Gelczuk Filip Dybała Paweł Modrzyński Robert Kudrawiec

Highly conductive paths in diamond and their application in high pressure measurements. ACS Applied Materials and Interfaces. 2024, vol. 16, nr 43, s. 59528-59535. ISSN: 1944-8244; 1944-8252
Zasoby:DOI URL SFX

Artykuł

2024

Andrzej Sikora Krzysztof R Gajewski Dominik Badura Bartosz Cz Pruchnik Tomasz Piasecki Kamil Raczkowski, Teodor Gotszalk

Conductive Atomic Force Microscopy—ultralow-current measurement systems for nanoscale imaging of a surface’s electrical properties. Sensors. 2024, vol. 24, nr 17, art. 5649, s. 1-13. ISSN: 1424-8220
Zasoby:DOI URL SFX

Artykuł

2024

Andrzej Sikora Łukasz Witos,

The implementation of AFM-based nanoscale diagnostic methods in the investigation of the degradation process of bacteriostatic acrylic film with silver nanoparticles. Applied Sciences. 2024, vol. 14, nr 8, art. 3503, s. 1-12. ISSN: 2076-3417
Zasoby:DOI URL SFX

Artykuł

2024

Bartosz Cz Pruchnik Andrzej Sikora Krzysztof R Gajewski Bartosz Świadkowski Piotr Smagowski Dominik Badura Krzysztof Kwoka Tomasz Piasecki Teodor Gotszalk

Educational scanning tunneling microscope – open architecture platform for nanotechnology teaching and nanometrology research. Przegląd Elektrotechniczny. 2024, R. 100, nr 6, s. 200-204. ISSN: 0033-2097; 2449-9544
Zasoby:DOI URL

Artykuł

2023

Beata Malczewska, Paweł Lochyński, Sylwia Charazińska, Andrzej Sikora Ramin Farnood,

Electrospun silica-polyacrylonitrile nanohybrids for water treatments. Membranes. 2023, vol. 13, nr 1, art. 72, s. 1-17. ISSN: 2077-0375
Zasoby:DOI URL SFX

Artykuł

2023

Sylvester Sahayaraj, Zbigniew Starowicz, Marcin Ziółek, Robert Socha, Łukasz Major, Anna Góral, Katarzyna Gawlińska-Nęcek, Marcin Palewicz Andrzej Sikora Tomasz Piasecki Teodor Gotszalk Marek Lipiński,

Synergistic effect of precursor and interface engineering enables high efficiencies in FAPbI3 perovskite solar cells. Materials. 2023, vol. 16, nr 15, art. 5352, s. 1-17. ISSN: 1996-1944
Zasoby:DOI URL SFX

Artykuł

2023

Simone Dinarelli, Andrzej Sikora Angela Sorbo, Marco Rossi, Daniele Passeri,

Atomic force microscopy as a tool for mechanical characterization at the nanometer scale. Nanomaterials and Energy. 2023, vol. 12, nr 2, s. 71-80. ISSN: 2045-9831; 2045-984X
Zasoby:DOI URL SFX

Artykuł

2023

Marcin Palewicz Andrzej Sikora Tomasz Piasecki Ewelina Gacka Paweł Nitschke, Paweł Gnida, Bożena Jarząbek, Teodor Gotszalk

Determination of the electrical parameters of iodine-doped polymer solar cells at the macro- and nanoscale for indoor applications. Energies. 2023, vol. 16, nr 12, art. 4741, s. 1-14. ISSN: 1996-1073
Zasoby:DOI URL SFX

All employee publications

Wyszukiwarka

dr hab. inż. Andrzej Sikora