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Faculty of Electronics, Photonics and Microsystems

Prof. Teodor Gotszalk, DSc, PhD, Eng

Email: teodor.gotszalk@pwr.edu.pl

Position: Head of Department

Unit: Faculty of Electronics, Photonics and Microsystems (N) » Department of Nanometrology

ul. Janiszewskiego 11/17, 50-372 Wrocław
building C-2, room 215
phone +48 71 320 3202


1
Article
2024
Bartosz Pruchnik, Dominik Badura, Władysław Kopczyński, Dariusz Czułek, Ivo Rangelow, Virpi Korpolainen, Andrzej Sierakowski, Andrew Yacoot, Teodor Gotszalk,
Application of active piezoresistive cantilevers in high-eigenmode surface imaging. Measurement Science & Technology. 2024, s. 1-15. ISSN: 0957-0233; 1361-6501
Resources:DOIURLImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
2
Article
2024
Bartosz Pruchnik, Krzysztof Kwoka, Ewelina Gacka, Dominik Badura, Andrzej Sierakowski, Paweł Janus, Tomasz Piasecki, Teodor Gotszalk,
New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructures. Beilstein Journal of Nanotechnology. 2024, vol. 15, s. 1273-1282. ISSN: 2190-4286
Resources:DOIURLSFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
3
Article
2024
Andrzej Sikora, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, Teodor Gotszalk,
Conductive Atomic Force Microscopy—ultralow-current measurement systems for nanoscale imaging of a surface’s electrical properties. Sensors. 2024, vol. 24, nr 17, art. 5649, s. 1-13. ISSN: 1424-8220
Resources:DOIURLSFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
4
Article
2024
Masoud Jedari Ghourichaei, Umut Kerimzade, Levent Demirkazik, Bartosz Pruchnik, Krzysztof Kwoka, Dominik Badura, Tomasz Piasecki, Alp Timucin Toymus, Onur Aydin, Bekir Aksoy, Cemal Aydogan, Gokhan Nadar, Ivo Rangelow, Levent Beker, Arda Deniz Yalcinkaya, Halil Bayraktar, Teodor Gotszalk, Burhanettin Erdem Alaca,
Multiscale fabrication and characterization of a NEMS force sensor. Advanced Materials Technologies. 2024, s. 1-9. ISSN: 2365-709X; 2365-709X
Resources:DOIURLImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
5
Article
2024
Ewelina Gacka, Bartosz Pruchnik, Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo Rangelow, Teodor Gotszalk,
Fabrication of focused ion beam-deposited nanowire probes for conductive atomic force microscopy. Measurement (London). 2024, vol. 234, art. 114815, s. 1-7. ISSN: 0263-2241; 1873-412X
Resources:DOIURLSFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
6
Article
2024
Bartosz Pruchnik, Janusz Fidelus, Ewelina Gacka, Leszek Zaraska, Grzegorz D Sulka, Teodor Gotszalk,
Atomic force microscopy in mechanical measurements of single nanowires. Ultramicroscopy. 2024, vol. 263, art. 113985, s. 1-15. ISSN: 0304-3991; 1879-2723
Resources:DOIURLSFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal List
7
Article
2024
Bartosz Pruchnik, Piotr Smagowski, Dominik Badura, Tomasz Piasecki, Wiktor Połacik, Piotr Putek, Teodor Gotszalk,
Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes. Measurement Science & Technology. 2024, vol. 35, nr 8, art. 085901, s. 1-9. ISSN: 0957-0233; 1361-6501
Resources:DOISFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
8
Article
2024
Bartosz Pruchnik, Andrzej Sikora, Bartosz Świadkowski, Piotr Smagowski, Dominik Badura, Krzysztof Kwoka, Tomasz Piasecki, Teodor Gotszalk,
Educational scanning tunneling microscope – open architecture platform for nanotechnology teaching and nanometrology research. Przegląd Elektrotechniczny. 2024, R. 100, nr 6, s. 200-204. ISSN: 0033-2097; 2449-9544
Resources:DOIURLImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
9
Article
2024
Bartosz Pruchnik, Tomasz Piasecki, Ewelina Gacka, Mateus G Masteghin, David Cox, Teodor Gotszalk,
Improvement of MEMS thermomechanical actuation efficiency by focused ion beam-induced deposition. Journal of Microelectromechanical Systems. 2024, vol. 33, nr 3, s. 362-368. ISSN: 1057-7157; 1941-0158
Resources:DOIURLSFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal List
10
Article
2024
Bartosz Pruchnik, Piotr Putek, Teodor Gotszalk,
Wavelet-based information theory in quantitative assessment of AFM images’ quality. Scientific Reports. 2024, vol. 14, art. 3996, s. 1-13. ISSN: 2045-2322
Resources:DOIURLSFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access

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