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Faculty of Electronics, Photonics and Microsystems

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Michał Krysztof, PhD

Email: michal.krysztof@pwr.edu.pl
Unit: Faculty of Electronics, Photonics and Microsystems (N) » Department of Microsystems

ul. Długa 61-65, 53-633 Wrocław
building M-6, room 36
phone +48 71 320 4974

Office hours

Research fields

  • Silicon and glass microengineering; MEMS and MOEMS; High Vacuum MEMS; electron microscopy.

Recent papers

2018

  • Krysztof M., Grzebyk T.P., Szyszka P., Laszczyk K., Górecka-Drzazga A., Dziuban J., Technology and parameters of thin membrane-anode for MEMS transmission electron microscope, Journal of Vacuum Science and Technology B, Nanotechnology & Microelectronics, 2018, vol. 36, nr 2, art. 02C107, s. 1-6.
  • Słówko W., Wiatrowski A., Krysztof M., Detection of secondary and backscattered electrons for 3D imaging with multi-detector method in VP/ESEM, Micron, 2018, vol. 104, s. 45-60.

2015

  • Krysztof M., Grzebyk T.P., Górecka-Drzazga A., Dziuban J., Zintegrowany, miniaturowy, transmisyjny mikroskop elektronowy, patent, P 413122 z dn. 14.07.2015. Opubl. 28.04.2017.
  • Krysztof M., Grzebyk T.P., Górecka-Drzazga A., Dziuban J., Electron beam forming in MEMS-type electron gun, 28th International Vacuum Nanoelectronics Conference, IVNC 2015: technical digest, July 13-17, 2015, Guangzhou, China, s. 194-195.
  • Krysztof M., Dziuban J., Górecka-Drzazga A., Grzebyk T.P., MEMS-type microchips for biological samples investigation in electron microscopy, Microscopy Conference, MC 2015, Göttingen, Germany, September 6-11, 2015, s. 342-344.

Papers in DONA database

1
Proceeding paper
2024
Michał Krysztof, Piotr Szyszka, Paweł Urbański, Tomasz Grzebyk,
High performance paper-CNT field emitters. W: 2024 37th International Vacuum Nanoelectronics Conference (IVNC) : Technical Digest : Brno, Czech Republic, 15-19 July, 2024. Danvers, MA : IEEE, cop. 2024. s. 1-2. ISBN: 979-8-3503-7976-1; 979-8-3503-7977-8
Resources:DOIURL
2
Proceeding paper
2024
Tomasz Grzebyk, Piotr Szyszka, Michał Krysztof, Paweł Urbański, Marcin Białas, Paweł Knapkiewicz, Jan Dziuban,
MEMS-based vacuum analytical instruments for space exploration. W: 2024 37th International Vacuum Nanoelectronics Conference (IVNC) : Technical Digest : Brno, Czech Republic, 15-19 July, 2024. Danvers, MA : IEEE, cop. 2024. s. 1-2. ISBN: 979-8-3503-7976-1; 979-8-3503-7977-8
Resources:DOIURL
3
Article
2024
Paweł Urbański, Tomasz Grzebyk, Michał Krysztof, Damian Nowak,
Optimization of the transmission X-ray target towards obtaining monochromatic radiation. Advanced Optical Materials. 2024, art. 2401534, s. 1-7. ISSN: 2195-1071
Resources:DOIImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal List
4
Patent
2024
Michał Krysztof, Wojciech Kubicki, Tomasz Grzebyk,
Michał Krysztof, Wojciech Kubicki, Tomasz P. Grzebyk
Patent. Polska, nr PL 245205, opubl. 03.06.2024. Zgłosz. nr 438521 z 19.07.2021. Miniaturowe urządzenie do żelowej elektroforezy kapilarnej z miniaturową wyrzutnią elektronową / Politechnika Wrocławska, Wrocław, PL ; Michał Krysztof, Wojciech Kubicki, Tomasz Grzebyk. 9 s.
Resources:URL
5
Article
2024
Michał Krysztof, Paweł Miera, Paweł Urbański, Tomasz Grzebyk, Matthias Hausladen, Rupert Schreiner,
Integrated silicon electron source for high vacuum microelectromechanical system devices. Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics. 2024, vol. 42, nr 2, art. 023001, s. 1-9. ISSN: 2166-2746; 2166-2754
Resources:DOISFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal List
6
Article
2023
Paweł Urbański, Marcin Białas, Michał Krysztof, Tomasz Grzebyk,
Transmission target for a MEMS X-ray source. Journal of Microelectromechanical Systems. 2023, vol. 32, nr 4, s. 398-404. ISSN: 1057-7157; 1941-0158
Resources:DOISFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal ListOpen Access
7
Proceeding paper
2023
Michał Krysztof, Marcin Białas, Tomasz Grzebyk,
Imaging using MEMS electron microscope. W: 36th International Vacuum Nanoelectronics Conference, IVNC : July 10-13, 2023, Cambridge MA, USA. Danvers, MA : IEEE, cop. 2023. s. 32-34. ISBN: 979-8-3503-0143-4
Resources:DOIURL
8
Proceeding paper
2023
Michał Krysztof, Paweł Miera, Paweł Urbański, Tomasz Grzebyk,
Integrated silicon electron source for High Vacuum Mems devices. W: 36th International Vacuum Nanoelectronics Conference, IVNC : July 10-13, 2023, Cambridge MA, USA. Danvers, MA : IEEE, cop. 2023. s. 210-212. ISBN: 979-8-3503-0143-4
Resources:DOIURL
9
Article
2023
Marcin Białas, Tomasz Grzebyk, Michał Krysztof,
Signal detection and imaging methods for MEMS electron microscope. Ultramicroscopy. 2023, vol. 244, art. 113653, s. 1-10. ISSN: 0304-3991; 1879-2723
Resources:DOIURLSFXImpact FactorMaster Journal ListMinistry of Science and Higher Education Journal List
10
Proceeding paper
2022
Paweł Urbański, Marcin Białas, Michał Krysztof, Tomasz Grzebyk,
Mems X-ray source: electron-radiation conversion. W: 2022 21st International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS), 12-15 December 2022, Utah, Salt Lake City, USA. [B.m.] : IEEE, 2022. s. 42-45. ISBN: 978-1-6654-9307-9; 978-1-6654-9306-2
Resources:DOIURL

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