Adam Szyszka, DSc, PhD, Eng
E-mail: adam.szyszka@pwr.edu.pl
Unit: Faculty of Electronics, Photonics and Microsystems (N) » Department of Microelectronics and Nanotechnology
ul. Długa 61-65, 53-633 Wrocław
building M-11, room 146
phone +48 71 320 4957
Selected publications |
1 | Article 2023
Michał Stępniak, Sylwia Owczarek, Characterization of the parasitic masking layer formed during GaN SA-MOVPE using PECVD SiO2 masks. Applied Surface Science. 2023, vol. 640, art. 158325, s. 1-8. ISSN: 0169-4332; 1873-5584 | Resources:DOIURLSFX |     |
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2 | Article 2022
Sylwia Baluta, Francesca Meloni, Kinga Halicka-Stępień, Antonio Zucca, Maria I Pilo, Differential pulse voltammetry and chronoamperometry as analytical tools for epinephrine detection using a tyrosinase-based electrochemical biosensor. RSC Advances. 2022, vol. 12, nr 39, s. 25342-25353. ISSN: 2046-2069 | Resources:DOISFX |     |
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3 | Article 2022
Scanning probe microscopy nanoscale electrical characterization of AlGaN/ GaN grown on structured GaN templates. Solid-State Electronics. 2022, vol. 193, art. 108288, s. 1-6. ISSN: 0038-1101; 1879-2405 | Resources:DOIURLSFX |    |
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4 | Proceeding paper 2021
Atomic layer etching of gallium nitride. W: 9th International Conference on Advances in Electronic and Photonic Technologies : proceedings of ADEPT, Podbanské, High Tatras, Slovakia, September 20-23, 2021 / [eds. D. Jandura, P. Maniaková, I. Lettrichová, J. Kováč, jr. B.m. : University of Žilina in EDIS-Publishing Centre of UZ, 2021]. s. 83-86. ISBN: 978-80-554-1806-3 |
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5 | Article 2021
Light-assisted scanning probe microscopy characterization of the electrical properties of AlGaN/GaN/Si heterostructures. Applied Surface Science. 2021, vol. 538, art. 148189, s. 1-12. ISSN: 0169-4332; 1873-5584 | Resources:DOISFX |    |
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6 | Article 2020
Enzymatic platforms for sensitive neurotransmitter detection. Sensors. 2020, vol. 20, nr 2, art. 423, s. 1-25. ISSN: 1424-8220 | Resources:DOIURLSFX |     |
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7 | Article 2019
Badanie elektrycznych właściwości powierzchni heterostruktur AlGaN/GaN/Si technikami mikroskopii ze skanującą sondą i oświetleniem = Characterization of the electrical properties of AlGaN/GaN heterostructures on a silicon substrate by scanning capacitance and scanning surface potential microscopy. Przegląd Elektrotechniczny. 2019, R. 95, nr 9, s. 157-160. ISSN: 0033-2097; 2449-9544 | Resources:DOIURL |    |
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8 | Proceeding paper 2019
Sławomir Owczarzak, Grzegorz Ilgiewicz, Mateusz Glinkowski, Agnieszka Zawadzka, Projekt technologii tranzystora AlGaN/GaN VHEMT. W: XVIII Krajowa Konferencja Elektroniki : Darłówko Wschodnie, 02-06.06.2019 / Uniwersytet Morski w Gdyni. [B.m. : b.w., 2019]. s. 1-5. |
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9 | Article 2019
Impact of gallium concentration in the gas phase on composition of InGaAsN alloys grown by AP‑MOVPE correlated with their structural and optical properties. Journal of Materials Science. Materials in Electronics. 2019, vol. 30, nr 17, s. 16216-16225. ISSN: 0957-4522; 1573-482X | Resources:DOISFX |     |
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10 | Article 2019
Surface electrical characterization of defect related inhomogeneities of AlGaN/GaN/Si heterostructures using scanning capacitance microscopy. Materials Science in Semiconductor Processing. 2019, vol. 94, s. 57-63. ISSN: 1369-8001 | Resources:DOISFX |    |
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All publications