| Wybrane publikacje |
|---|
| 1 | Artykuł 2025
Dominik Badura, Władysław Kopczyński, Dariusz Czułek, Ivo Rangelow, Virpi Korpolainen, Andrzej Sierakowski, Andrew Yacoot, | Application of active piezoresistive cantilevers in high-eigenmode surface imaging. Measurement Science & Technology. 2025, vol. 36, nr 1, art. 016020, s. 1-12. ISSN: 0957-0233; 1361-6501 | | Zasoby:DOIURLSFX |     |
|
| 2 | Artykuł 2025
Masoud Jedari Ghourichaei, Umut Kerimzade, Levent Demirkazik, Dominik Badura, Alp Timucin Toymus, Onur Aydin, Bekir Aksoy, Cemal Aydogan, Gokhan Nadar, Ivo Rangelow, Levent Beker, Arda Deniz Yalcinkaya, Halil Bayraktar, Burhanettin Erdem Alaca, | Multiscale fabrication and characterization of a NEMS force sensor. Advanced Materials Technologies. 2025, vol. 10, nr 4, s. 1-9. ISSN: 2365-709X; 2365-709X | | Zasoby:DOIURLSFX | |
|
| 3 | Artykuł 2024
René Laflamme, Piotr Putek, | Digital analysis of damped vibrations. IEEE Instrumentation & Measurement Magazine. 2024, vol. 27, nr 5, s. 52-61. ISSN: 1094-6969; 1941-0123 | | Zasoby:DOIURLSFX | |
|
| 4 | Artykuł 2024
Dominik Badura, Andrzej Sierakowski, Paweł Janus, | New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructures. Beilstein Journal of Nanotechnology. 2024, vol. 15, s. 1273-1282. ISSN: 2190-4286 | | Zasoby:DOIURLSFX | |
|
| 5 | Artykuł 2024
Dominik Badura, Kamil Raczkowski, | Conductive Atomic Force Microscopy—ultralow-current measurement systems for nanoscale imaging of a surface’s electrical properties. Sensors. 2024, vol. 24, nr 17, art. 5649, s. 1-13. ISSN: 1424-8220 | | Zasoby:DOIURLSFX | |
|
| 6 | Artykuł 2024
Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo Rangelow, | Fabrication of focused ion beam-deposited nanowire probes for conductive atomic force microscopy. Measurement (London). 2024, vol. 234, art. 114815, s. 1-7. ISSN: 0263-2241; 1873-412X | | Zasoby:DOIURLSFX | |
|
| 7 | Artykuł 2024
Piotr Smagowski, Dominik Badura, Wiktor Połacik, Piotr Putek, | Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes. Measurement Science & Technology. 2024, vol. 35, nr 8, art. 085901, s. 1-9. ISSN: 0957-0233; 1361-6501 | | Zasoby:DOISFX | |
|
| 8 | Artykuł 2024
Bartosz Świadkowski, Piotr Smagowski, Dominik Badura, | Educational scanning tunneling microscope – open architecture platform for nanotechnology teaching and nanometrology research. Przegląd Elektrotechniczny. 2024, R. 100, nr 6, s. 200-204. ISSN: 0033-2097; 2449-9544 | | Zasoby:DOIURL | |
|
| 9 | Artykuł 2024
Mateus G Masteghin, David Cox, | Improvement of MEMS thermomechanical actuation efficiency by focused ion beam-induced deposition. Journal of Microelectromechanical Systems. 2024, vol. 33, nr 3, s. 362-368. ISSN: 1057-7157; 1941-0158 | | Zasoby:DOIURLSFX | |
|
| 10 | Artykuł 2024
Janusz Fidelus, Leszek Zaraska, Grzegorz D Sulka, | Atomic force microscopy in mechanical measurements of single nanowires. Ultramicroscopy. 2024, vol. 263, art. 113985, s. 1-15. ISSN: 0304-3991; 1879-2723 | | Zasoby:DOIURLSFX | |
|
