ul. Długa 61-65, 53-633 Wrocław
building M-6, room 36
phone +48 71 320 4974

Office hours

Research fields

• Silicon and glass microengineering; MEMS and MOEMS; High Vacuum MEMS; electron microscopy.

Recent papers

2018

• Krysztof M., Grzebyk T.P., Szyszka P., Laszczyk K., Górecka-Drzazga A., Dziuban J., Technology and parameters of thin membrane-anode for MEMS transmission electron microscope, Journal of Vacuum Science and Technology B, Nanotechnology & Microelectronics, 2018, vol. 36, nr 2, art. 02C107, s. 1-6.
• Słówko W., Wiatrowski A., Krysztof M., Detection of secondary and backscattered electrons for 3D imaging with multi-detector method in VP/ESEM, Micron, 2018, vol. 104, s. 45-60.

2015

• Krysztof M., Grzebyk T.P., Górecka-Drzazga A., Dziuban J., Zintegrowany, miniaturowy, transmisyjny mikroskop elektronowy, patent, P 413122 z dn. 14.07.2015. Opubl. 28.04.2017.
• Krysztof M., Grzebyk T.P., Górecka-Drzazga A., Dziuban J., Electron beam forming in MEMS-type electron gun, 28th International Vacuum Nanoelectronics Conference, IVNC 2015: technical digest, July 13-17, 2015, Guangzhou, China, s. 194-195.
• Krysztof M., Dziuban J., Górecka-Drzazga A., Grzebyk T.P., MEMS-type microchips for biological samples investigation in electron microscopy, Microscopy Conference, MC 2015, Göttingen, Germany, September 6-11, 2015, s. 342-344.

Papers in DONA database

Selected publications
1	Komunikat konferencyjny 2025 Michał Krysztof Kamil J Baranowski Michał Zychla, Matthias Hausladen, Rupert Schreiner, Aleksander Knápek, Detection of electron beam in atmospheric pressure using CMOS image sensor. W: EUROSENSORS 2025, 37th European Conference on Solid-State Transducers : Wroclaw, Poland - Sept. 7th-10th 2025 : book of abstracts. Wunstorf : AMA Service GmbH, cop. 2025. s. 325-326. ISBN: 978-3-910600-07-2 Zasoby:DOIURL
2	Referat konferencyjny 2025 Mathias Bartl, Matthias Hausladen, Ali Asgharzade, Philipp Buchner, Michał Krysztof Aleksander Knápek, Michael Bachmann, Rupert Schreiner, Experimental method for investigation of the emission pattern characteristics of individual field emission tips using a CMOS image sensor. W: 2025 38th International Vacuum Nanoelectronics Conference (IVNC) : Reykjavik, Iceland, 08-11 July, 2025. Danvers, MA : IEEE, cop. 2025. s. 1-2. ISBN: 979-8-3315-3705-0; 979-8-3315-3706-7 Zasoby:DOI
3	Referat konferencyjny 2025 Mohammad M Allaham, Daniel Burda, Aleksander Knápek, Michał Krysztof Kamil J Baranowski Matthias Hausladen, Rupert Schreiner, Testing the performance of tungsten-graphite cathodes as MEMS electron microscope electron source. W: 2025 38th International Vacuum Nanoelectronics Conference (IVNC) : Reykjavik, Iceland, 08-11 July, 2025. Danvers, MA : IEEE, cop. 2025. s. 1-2. ISBN: 979-8-3315-3705-0; 979-8-3315-3706-7 Zasoby:DOI
4	Referat konferencyjny 2025 Michał Krysztof Kamil J Baranowski Piotr Szyszka Tomasz P Grzebyk Fabrication and testing of the projection lens for miniaturized transmission electron microscope. W: 2025 38th International Vacuum Nanoelectronics Conference (IVNC) : Reykjavik, Iceland, 08-11 July, 2025. Danvers, MA : IEEE, cop. 2025. s. 1-2. ISBN: 979-8-3315-3705-0; 979-8-3315-3706-7 Zasoby:DOI
5	Referat konferencyjny 2025 Kamil J Baranowski Michał Zychla, Michał Krysztof Michał A Żółtowski Matthias Hausladen, Rupert Schreiner, Aleksander Knápek, Experimental method for studying electron beams in gaseous environments using a CMOS image sensor. W: 2025 38th International Vacuum Nanoelectronics Conference (IVNC) : Reykjavik, Iceland, 08-11 July, 2025. Danvers, MA : IEEE, cop. 2025. s. 1-2. ISBN: 979-8-3315-3705-0; 979-8-3315-3706-7 Zasoby:DOI
6	Referat konferencyjny 2025 Tomasz P Grzebyk Piotr Szyszka Michał Krysztof Paweł Urbański Marcin S Białas Jakub Jendryka MEMS-based Vacuum Nanoelectronic Instruments. W: 2025 38th International Vacuum Nanoelectronics Conference (IVNC) : Reykjavik, Iceland, 08-11 July, 2025. Danvers, MA : IEEE, cop. 2025. s. 1-2. ISBN: 979-8-3315-3705-0; 979-8-3315-3706-7 Zasoby:DOI
7	Patent 2025 Karolina Laszczyk Tomasz P Grzebyk Anna Górecka-Drzazga Michał Krysztof Karolina Laszczyk, Tomasz P. Grzebyk, Anna Górecka-Drzazga, Michał Krysztof Patent. Polska, nr PL 247109, opubl. 12.05.2025. Zgłosz. nr P. 428626 z 21.01.2019. Sposób wytwarzania katody polowej do emisji elektronów = Method of producing a field emission cathode / Politechnika Wrocławska, Wrocław, PL ; Karolina Laszczyk [i in.]. 13 s. Zasoby:URL
8	Referat konferencyjny 2024 Michał Krysztof Piotr Szyszka Paweł Urbański Tomasz P Grzebyk High performance paper-CNT field emitters. W: 2024 37th International Vacuum Nanoelectronics Conference (IVNC) : Technical Digest : Brno, Czech Republic, 15-19 July, 2024. Danvers, MA : IEEE, cop. 2024. s. 1-2. ISBN: 979-8-3503-7976-1; 979-8-3503-7977-8 Zasoby:DOIURL
9	Referat konferencyjny 2024 Tomasz P Grzebyk Piotr Szyszka Michał Krysztof Paweł Urbański Marcin S Białas Paweł Knapkiewicz Jan Dziuban MEMS-based vacuum analytical instruments for space exploration. W: 2024 37th International Vacuum Nanoelectronics Conference (IVNC) : Technical Digest : Brno, Czech Republic, 15-19 July, 2024. Danvers, MA : IEEE, cop. 2024. s. 1-2. ISBN: 979-8-3503-7976-1; 979-8-3503-7977-8 Zasoby:DOIURL
10	Artykuł 2024 Paweł Urbański Tomasz P Grzebyk Michał Krysztof Damian Nowak Optimization of the transmission X-ray target towards obtaining monochromatic radiation. Advanced Optical Materials. 2024, vol. 12, nr 32, art. 2401534, s. 1-7. ISSN: 2195-1071 Zasoby:DOISFX

All employee publications